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Effect of Pocket Doping and Annealing Schemes on the Source-Pocket Tunnel Field-Effect Transistor

✍ Scribed by Jhaveri, R.; Nagavarapu, V.; Woo, J.C.S.

Book ID: 114620270
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 459 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2010.2089525

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