## Abstract Influences of O~2~/Ar flux ratio (__R__) on surface morphology and structural evolution have been studied in the case of ZnO films deposited on glass substrates by radioβfrequency (rf) magnetron sputtering. Results of atomic force microscopy (AFM), Xβray diffraction, and Xβray photoelec
β¦ LIBER β¦
Effect of LP-buffer on the structure of ZnO thin films prepared on glass substrate using RF magnetron sputtering
β Scribed by Zhu Xingwen; Li Yingwei; Li Yongqiang; Ma Ji; Xia Yiben
- Book ID
- 106397746
- Publisher
- Springer US
- Year
- 2007
- Tongue
- English
- Weight
- 417 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0957-4522
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