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Effect of interfacial SiO2thickness for low temperature O2plasma activated wafer bonding

✍ Scribed by Benoit Olbrechts; Xuanxiong Zhang; Yannick Bertholet; Thomas Pardoen; Jean-Pierre Raskin


Book ID
106184827
Publisher
Springer-Verlag
Year
2005
Tongue
English
Weight
334 KB
Volume
12
Category
Article
ISSN
0946-7076

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