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Effect of interface traps on Debye thickness semiconductor films

✍ Scribed by V. Sandomirsky; A.V. Butenko; I.G. Kolobov; A. Ronen; Y. Schlesinger


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
488 KB
Volume
252
Category
Article
ISSN
0169-4332

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