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Effect of high-temperature processing on the creation of boron-related deep levels in 4H-SiC

✍ Scribed by Hrishikesh Das; Yaroslav Koshka; Michael S. Mazzola; Swapna G. Sunkari; J. L. Wyatt


Book ID
107453620
Publisher
Springer US
Year
2006
Tongue
English
Weight
174 KB
Volume
35
Category
Article
ISSN
0361-5235

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