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Effect of germanium pre-amorphization on solid-phase epitaxial regrowth of antimony and arsenic ion-implanted silicon

✍ Scribed by Shahram Ghanad Tavakoli; Sungkweon Baek; Hyunsang Hwang


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
161 KB
Volume
114-115
Category
Article
ISSN
0921-5107

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Medium energy ion scattering (MEIS) has been used to study the kinetics of solid phase epitaxial regrowth (SPEG) of ultrathin amorphous layers created by room temperature implantation of 5 keV energy phosphorus ions into Si(1 0 0). P ion fluences ranged from 5e14 cm Γ€2 up to 1e16 cm Γ€2 , the associa