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Effect of film thickness on the energy band gap of nanocrystalline CdS thin films analyzed by spectroscopic ellipsometry

✍ Scribed by N.S. Das; P.K. Ghosh; M.K. Mitra; K.K. Chattopadhyay

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
657 KB
Volume
42
Category
Article
ISSN
1386-9477

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The gap of Si nanocrystalline films has been computed using a non-orthogonal tight-binding approach. We have studied the influence of different types of disorder: inter-grain distance, intergrain misorientation, and film roughness on the gap value of these Si films. In all the cases, the variation o