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Effect of film thickness on ferroelectric domain structure and properties of Pb(Zr0.35Ti0.65)O3/SrRuO3/SrTiO3heterostructures

✍ Scribed by Hitoshi Morioka; Keisuke Saito; Shintaro Yokoyama; Takahiro Oikawa; Toshiyuki Kurosawa; Hiroshi Funakubo

Publisher
Springer
Year
2009
Tongue
English
Weight
522 KB
Volume
44
Category
Article
ISSN
0022-2461

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πŸ“œ SIMILAR VOLUMES

Frequency–temperature response of Pb(Zr0
Frequency–temperature response of Pb(Zr0.65βˆ’xCexTi0.35)O3 ferroelectric ceramics: Structural and dielectric studies
✍ Balgovind Tiwari; R.N.P. Choudhary πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 935 KB

A high-temperature solid-state reaction technique was used to prepare polycrystalline samples of Pb(Zr 0.65Γ€x Ce x Ti 0.35 )O 3 (x ΒΌ 0, 0.05, 0.10, 0.15) (PZCT). X-ray diffraction (XRD) technique and scanning electron microscopy (SEM) were used to study the structural and microstructural properties