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Structural and electrical properties of Pb(Zr0.53Ti0.47)O3 films prepared on La0.5Sr0.5CoO3 coated Si substrates

✍ Scribed by Feng Chen; Jinrong Cheng; Shenwen Yu; Zhongyan Meng

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
399 KB
Volume
30
Category
Article
ISSN
0955-2219

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Pb(Zr 0.53 Ti 0.47 )O 3 (PZT) thin films grown on Pt-coated Si substrates were prepared by a sol-gel process. Crystalline structure characterisation and optical constants (refractive index n, extinction coefficient k) and bandgaps E g of PZT thin films annealed at 550, 600 and 650 β€’ C were obtained