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An XPS study and electrical properties of Pb1.1Zr0.53Ti0.47O3/PbO/Si (MFIS) structures according to the substrate temperature of the PbO buffer layer

✍ Scribed by Chul-Ho Park; Mi-Sook Won; Young-Hun Oh; Young-Gook Son


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
285 KB
Volume
252
Category
Article
ISSN
0169-4332

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