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Effect of film thickness and grain size on fatigue-induced dislocation structures in Cu thin films

✍ Scribed by Zhang, G. P.; Schwaiger, R.; Volkert, C. A.; Kraft, O.


Book ID
127264172
Publisher
Taylor and Francis Group
Year
2003
Tongue
English
Weight
382 KB
Volume
83
Category
Article
ISSN
0950-0839

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