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Effect of electron bombardment on the stabilization of the characteristics of silicon detectors with a thin “dead” layer

✍ Scribed by R. A. Muminov; V. N. Pod'yachev; V. T. Malaeva; U. B. Dzhuraev; M. M. Oksman; G. V. Ishmuratov

No coin nor oath required. For personal study only.

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