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The effect of electron bombardment on the electrophysical properties of tellurium thin films


Publisher
Elsevier Science
Year
1968
Tongue
English
Weight
138 KB
Volume
18
Category
Article
ISSN
0042-207X

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Thin overlayer influence on electrophysi
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In this work it is experimentally investigated a size effect in temperature coefficient of resistance (Π’CR) of Ni films with Cu and SiO 2 thin overlayer. The parameters of electrical transfer (the mean-free path of electron, the reflectivity coefficient of the external surfaces, the reflection and t