๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Effect of electromigration on intermetallic compound formation in line-type Cu/Sn/Cu interconnect

โœ Scribed by L.D. Chen; M.L. Huang; S.M. Zhou


Book ID
116606968
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
966 KB
Volume
504
Category
Article
ISSN
0925-8388

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES