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Effect of edge roughness on electronic transport in graphene nanoribbon channel metal-oxide-semiconductor field-effect transistors

✍ Scribed by Basu, D.; Gilbert, M. J.; Register, L. F.; Banerjee, S. K.; MacDonald, A. H.

Book ID
120423532
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
703 KB
Volume
92
Category
Article
ISSN
0003-6951

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