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Effect of crystallization temperature on microstructure and ferroelectric properties of (Bi,Nd)4Ti3O12 thin films prepared by chemical solution deposition

✍ Scribed by Fang Hou; Mingrong Shen


Book ID
108215210
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
443 KB
Volume
122
Category
Article
ISSN
0921-5107

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Effects of annealing schedule on orienta
✍ H.Y. He; J.F. Huang; L.Y. Cao; L.S. Wang πŸ“‚ Article πŸ“… 2006 πŸ› Elsevier Science 🌐 English βš– 633 KB

Fatigue-free Bi 3.2 Nd 0.8 Ti 3 O 12 ferroelectric thin films were successfully prepared on p-Si(1 1 1) substrate using chemical solution deposition process. The orientation and formation of thin film under different annealing schedules were studied. XRD analysis indicated that (2 0 0)-oriented film