Structural and dielectric properties of Bi4Ti3O12 thin films prepared by metalorganic solution deposition
β Scribed by X.S. Wang; Y.J. Zhang; L.Y. Zhang; X. Yao
- Publisher
- Springer
- Year
- 1999
- Tongue
- English
- Weight
- 213 KB
- Volume
- 68
- Category
- Article
- ISSN
- 1432-0630
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π SIMILAR VOLUMES
Ca(Zr 0.05 Ti 0.95 )O 3 (CZT) thin films were grown on Pt(1 1 1)/Ti/SiO 2 /Si(1 0 0) substrates by the soft chemical method. The films were deposited from spin-coating technique and annealed at 928 K for 4 h under oxygen atmosphere. CZT films present orthorhombic structure with a crack free and gran
## Abstract Smβdoped bismuth titanate and random oriented Bi~4β__x__~Sm__~x~__Ti~3~O~12~ (BST) thin films were fabricated on Pt/Ti/SiO~2~/Si substrates using a pulsed laser deposition method. The structures and the ferroelectric properties of the films were investigated. Sm doping leads to a marked