Ferroelectric properties of Sm-doped Bi4Ti3O12thin films
β Scribed by Chen, M. ;Liu, Z. L. ;Wang, Y. ;Yao, K. L.
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 230 KB
- Volume
- 202
- Category
- Article
- ISSN
- 0031-8965
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
Smβdoped bismuth titanate and random oriented Bi~4βx~Sm__~x~Ti~3~O~12~ (BST) thin films were fabricated on Pt/Ti/SiO~2~/Si substrates using a pulsed laser deposition method. The structures and the ferroelectric properties of the films were investigated. Sm doping leads to a marked improvement in the remanent polarization (P~r~) and the coercive field (E~c~). At an applied electric field of 100 kV/cm, P~r~ and E~c~ of a BST (x = 0.8) film annealed at 650 Β°C are 20.5 Β΅C/cm^2^ and 60 kV/cm, respectively. However, after 3 Γ 10^10^ switching cycles, 20% degradation of 2__P~r~ is observed in the film. (Β© 2005 WILEYβVCH Verlag GmbH & Co. KGaA, Weinheim)
π SIMILAR VOLUMES
Leakage current in ferroelectric devices is important because it affects the saturation. Rare earth substituted bismuth titanate (Bi 4 Ti 3 O 12 ) electroceramics has emerged as new material system for non-volatile ferroelectric memory. We synthesized Bi 4Kx M x Ti 3 O 12 (MZNd, Sm) for different co