Effect of C layer on the structures and magnetic properties of (0 0 1)-oriented [C/CoPt]n/Ag films
β Scribed by Tao Jin; Xiao-Hong Xu; Feng-Xian Jiang; Xiao-Li Li; Fang Wang; Xiao-Hua Shen; Rui-Qiang Zhang; Hai-Shun Wu
- Book ID
- 108060012
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 194 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0169-4332
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Heteroepitaxial Fe films on GaN(0 0 0 1) are grown at 50, 350 and 500 1C by molecular beam epitaxy. The structural properties of these films are studied in situ by reflection high-energy electron diffraction f scans and ex situ by electron backscatter diffraction and longitudinal as well as azimuth
a b s t r a c t (1 0 0)-oriented b-FeSi 2 films were epitaxially grown on 3C-SiC-buffered Si(1 0 0) substrates by co-sputtering iron and silicon. The full-width at half maximum of the rocking curve of the b-FeSi 2 800 diffraction peaks was 1.81. The epitaxial relationship between b-FeSi 2 and 3C-Si