Effect of BTI Degradation on Transistor Variability in Advanced Semiconductor Technologies

✍ Scribed by Sangwoo Pae; Maiz, J.; Prasad, C.; Woolery, B.

• Book ID: 118165537
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 918 KB
• Volume: 8
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/tdmr.2008.2002351