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Effect of bias frequency variation on the characteristics of SiOX thin films deposited by atmospheric pressure chemical vapor deposition using a double discharge system

✍ Scribed by Park, Jaebeom; Kim, Ga Young; Yeom, Geunyoung


Book ID
121793828
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
1000 KB
Volume
539
Category
Article
ISSN
0040-6090

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