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Effect of annealing ambient on structure and ferroelectric properties of Pb(Zr0.4Ti0.6)O3 thin films on LaNiO3 coated Si substrates

✍ Scribed by J.H. Ma; X.J. Meng; J.L. Sun; T. Lin; F.W. Shi; J.H. Chu

No coin nor oath required. For personal study only.

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