## Abstract Influences of O~2~/Ar flux ratio (__R__) on surface morphology and structural evolution have been studied in the case of ZnO films deposited on glass substrates by radioβfrequency (rf) magnetron sputtering. Results of atomic force microscopy (AFM), Xβray diffraction, and Xβray photoelec
β¦ LIBER β¦
Effect of amorphous C films deposited by RF magnetron sputtering on smoothing K9 glass substrate
β Scribed by Songwen Deng; Hongji Qi; Chaoyang Wei; Kui Yi; Zhengxiu Fan; Jianda Shao
- Book ID
- 108064151
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 317 KB
- Volume
- 256
- Category
- Article
- ISSN
- 0169-4332
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