Editorial: Imaging & Microscopy 3/2008

• Publisher: Wiley (John Wiley & Sons)
• Year: 2008
• Weight: 315 KB
• Volume: 10
• Category: Article
• ISSN: 1439-4243
• DOI: 10.1002/imic.200890083

✦ Synopsis

The August issue of Imaging & Microscopy highlights the 14 th European Microscopy Congress EMC 2008 that will be held in Aachen, Germany, on 1-5 September. The congress offers a broad scientific program covering all aspects of modern microscopy. World leading experts will talk on latest developments in their field and state-of-the-art research. Oral sessions will be contributed by courses of tutorial nature and by the presentation and discussion of posters. The scientific program will be topped-off by a major trade exhibition. For detailed information we would like to focus your attention to the European Microscopy Society's Newsletter on page 23. In this issue we have the pleasure to present a special section EMC 2008 with excellent contributions from plenary lecturers and invited speakers of the congress:

Reconstructed phase image of graphene. C.