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EBSD measurements of elastic strain fields in a GaN/sapphire structure

✍ Scribed by J.F. Luo; Y. Ji; T.X. Zhong; Y.Q. Zhang; J.Z. Wang; J.P. Liu; N.H. Niu; J. Han; X. Guo; G.D. Shen

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
210 KB
Volume
46
Category
Article
ISSN
0026-2714

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