Based on a more realistic description of the in-depth secondary electron generation than that of standard (constant loss) model, a new model for the e-induced secondary electron emission yield, d = f(E 0 ), is applied to account for the observed mean atomic number dependence of the reduced yield cur
β¦ LIBER β¦
Dynamic simulation of secondary electron emission and charging up of an insulating material
β Scribed by K. Ohya; K. Inai; H. Kuwada; T. Hayashi; M. Saito
- Book ID
- 108278437
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 661 KB
- Volume
- 202
- Category
- Article
- ISSN
- 0257-8972
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