An algorithm for stuck-at fault coverage
โ
Leonard J. Tung
๐
Article
๐
1989
๐
Elsevier Science
๐
English
โ 726 KB
An algorithm for stuck-at fault coverage analysis of digital logic circuits is presented. Based on a recently developed stuck-at fault model, the algorithm determines the effectiveness of a given test input set. The algorithm is applicable for studying sequential logic circuits, as well as combinati