✦ LIBER ✦

Dual functional distribution of failure in GaAs multichip microwave monolithic integrated circuits (MMICs)

✍ Scribed by Christou, A.; Tang, P.F.; Hu, J.M.

Book ID: 114534823
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 573 KB
Volume: 39
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.158792

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Process-induced defects in manufacture o

Process-induced defects in manufacture of GaAs monolithic microwave integrated circuits

✍ R.K. Purohit; G.C. Dubey; S. Dayal; R. Gulati; V.R. Balakrishnan; Koteshwar Rao; 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 304 KB

Semi-insulating liquid-incapsulated Czochralski GaAs wafers are generally used as substrates for the fabrication of monolithic microwave integrated circuits. In the fabrication process, the wafer is subjected to temperature cycling during the various stages of processing, namely post-ion implantatio

Ga0.51In0.49P/InxGa1−xAs/GaAs doped-chan

Ga0.51In0.49P/InxGa1−xAs/GaAs doped-channel FETs (DCFETs) and their applications on monolithic microwave integrated circuits (MMICs)

✍ Yo-Sheng Lin; Chih-Chen Chen; Shey-Shi Lu 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 282 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Temperature distribution in power GaAs field effect transistors using spatially resolved photoluminescence mapping

✍ Landesman, J.P.; Martin, E.; Braun, P. 📂 Article 📅 1999 🏛 IEEE ⚖ 561 KB