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Drain structure optimization for highly reliable deep submicrometer n-channel MOSFET

โœ Scribed by Matsuoka, F.; Kasai, K.; Oyamatsu, H.; Kinugawa, M.; Maeguchi, K.


Book ID
114535593
Publisher
IEEE
Year
1994
Tongue
English
Weight
623 KB
Volume
41
Category
Article
ISSN
0018-9383

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