MOSFET drain engineering analysis for deep-submicrometer dimensions: a new structural approach

✍ Scribed by Shin, H.; Tasch, A.F., Jr.; Bordelon, T.J.; Maziar, C.M.

• Book ID: 114534696
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 734 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.144685