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Double-Epilayer Structure for Low Drain Voltage Rating n-Channel Power Trench MOSFET Devices

✍ Scribed by Minhua Li; Crellin, A.; Ihsiu Ho; Qi Wang

Book ID: 111878514
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 721 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.923523

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