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Drain-induced barrier lowering in buried-channel MOSFET's

✍ Scribed by Van der Tol, M.J.; Chamberlain, S.G.

Book ID: 114535087
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 744 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.202786

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