Drain-induced barrier-lowering analysis in VSLI MOSFET devices using two-dimensional numerical simulations

✍ Scribed by Chamberlain, S.G.; Ramanan, S.

• Book ID: 114595730
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 919 KB
• Volume: 33
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1986.22737