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Drain Breakdown Voltage in MuGFETs: Influence of Physical Parameters

โœ Scribed by Lee, C.-W.; Afzalian, A.; Yan, R.; Akhavan, N.D.; Weize Xiong; Colinge, J.-P.


Book ID
114619228
Publisher
IEEE
Year
2008
Tongue
English
Weight
668 KB
Volume
55
Category
Article
ISSN
0018-9383

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