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Double layer structure of ZnO thin films deposited by RF-magnetron sputtering on glass substrate

✍ Scribed by C. Besleaga; G.E. Stan; A.C. Galca; L. Ion; S. Antohe

Book ID
116245351
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
985 KB
Volume
258
Category
Article
ISSN
0169-4332

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## Abstract Influences of O~2~/Ar flux ratio (__R__) on surface morphology and structural evolution have been studied in the case of ZnO films deposited on glass substrates by radio‐frequency (rf) magnetron sputtering. Results of atomic force microscopy (AFM), X‐ray diffraction, and X‐ray photoelec