✦ LIBER ✦

Double-crystal topography with polarized synchrotron X-rays

✍ Scribed by Ulrich Bonse; Szczesny Kraśnicki; Rainer Teworte

Publisher: Elsevier Science
Year: 1983
Weight: 101 KB
Volume: 208
Category: Article
ISSN: 0167-5087
DOI: 10.1016/0167-5087(83)91209-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Synchrotron X-ray topography of bismuth

Synchrotron X-ray topography of bismuth silicon oxide crystals

✍ J. Martínez-López; M. González-Mañas; M.A. Caballero; E. Diéguez; B. Capelle 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 205 KB

Computer-planned synchrotron white X-ray

Computer-planned synchrotron white X-ray topography

✍ I.A. Sheremetyev; A.V. Turbal; Yu.M. Litvinov; M.A. Mikhailov 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 426 KB

A station for synchrotron X-ray topograp

A station for synchrotron X-ray topography

✍ V.V. Lider; O.P. Aleshko-Ozhevskij; Yu.N. Shilin; M.V. Kovalchuk; Yu.M. Litvinov 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 160 KB

Synchrotron X-ray topography site at HAS

Synchrotron X-ray topography site at HASYLAB

✍ H. Bradaczek; G. Hildebrandt; G. Jähnig; J.D. Stephenson; W. Graeff 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 323 KB

Quantitative double-crystal X-ray disper

Quantitative double-crystal X-ray dispersion topography with a point focus source

✍ J. Kub; Z. S̆ourek 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 620 KB

Quality Assessment of Sapphire Wafers fo

Quality Assessment of Sapphire Wafers for X-Ray Crystal Optics Using White Beam Synchrotron X-Ray Topography

✍ Chen, W.M. ;McNally, P.J. ;Shvydko, Yu.V. ;Tuomi, T. ;Lerche, M. ;Danilewsky, A. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 162 KB 👁 1 views

The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering