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Computer-planned synchrotron white X-ray topography

✍ Scribed by I.A. Sheremetyev; A.V. Turbal; Yu.M. Litvinov; M.A. Mikhailov

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
426 KB
Volume
308
Category
Article
ISSN
0168-9002

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The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering