✦ LIBER ✦

DLTS study of defect creation in amorphous-silicon thin-film transistors

✍ Scribed by N. Nickel; W. Fuhs; H. Mell

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Defect creation kinetics in amorphous si

✍ R.B. Wehrspohn; S.C. Deane; M.J. Powell 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 93 KB

Thermally stimulated defect removal in h

✍ P.N. Morgan; W.I. Milne; S.C. Deane; M.J. Powell 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 318 KB

Evidence for metastable defects in amorp

✍ A.R. Hepburn; J.M. Marshall; C. Main; M.J. Powell; C. Van Berkel 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 166 KB

Stability of amorphous-silicon thin-film

✍ Powell, M.J.; Nicholls, D.H. 📂 Article 📅 1983 🏛 The Institution of Electrical Engineers ⚖ 394 KB

Analysis of amorphous silicon thin-film

✍ M. Hack; M. Shur 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 165 KB

Characterization of defect removal in hy

✍ A.J. Flewitt; S. Lin; W.I. Milne; R.B. Wehrspohn; M.J. Powell 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 128 KB