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Defect creation kinetics in amorphous silicon thin film transistors

โœ Scribed by R.B. Wehrspohn; S.C. Deane; M.J. Powell


Book ID
117145426
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
93 KB
Volume
299-302
Category
Article
ISSN
0022-3093

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