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Characterization of defect removal in hydrogenated and deuterated amorphous silicon thin film transistors

โœ Scribed by A.J. Flewitt; S. Lin; W.I. Milne; R.B. Wehrspohn; M.J. Powell


Book ID
116669119
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
128 KB
Volume
352
Category
Article
ISSN
0022-3093

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