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Distribution of deep-level traps at atomic-layer-deposited Al2O3/n-GaN interface

✍ Scribed by Dawei Yan; Hai Lu; Dunjun Chen; Rong Zhang; Youdou Zheng; Xu Qian; Aidong Li

Book ID: 113916142
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 370 KB
Volume: 72
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2012.02.012

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