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Displacement Damage Effects Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Submicron Technology

✍ Scribed by Virmontois, Cedric; Goiffon, Vincent; Magnan, Pierre; Girard, Sylvain; Inguimbert, Christophe; Petit, Sophie; Rolland, Guy; Saint-Pe, Olivier

Book ID: 120079679
Publisher: IEEE
Year: 2010
Tongue: English
Weight: 662 KB
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2010.2085448

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