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[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Degradation of spectral response and dark current of CMOS image sensors in deep-submicron technology due to γ-irradiation

✍ Scribed by Rao, Padmakumar R.; Xinyang Wang, ; Theuwissen, Albert J. P.

Book ID: 118044704
Publisher: IEEE
Year: 2007
Weight: 255 KB
Volume: 0
Category: Article
ISBN: 1424411238
DOI: 10.1109/essderc.2007.4430955

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