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[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Characterization of the pile-up of As at the SiO2/Si interface

✍ Scribed by Steen, Christian; Martinez-Limia, Alberto; Pichler, Peter; Ryssel, Heiner; Pei, Lirong; Duscher, Gerd; Windl, Wolfgang

Book ID: 111871544
Publisher: IEEE
Year: 2007
Weight: 314 KB
Volume: 0
Category: Article
ISBN: 1424411238
DOI: 10.1109/essderc.2007.4430929

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