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Direct observation of the effect of solder voids on the current uniformity of power transistors

✍ Scribed by Sunshine, R.A.; D'Aiello, R.V.

Book ID: 114591797
Publisher: IEEE
Year: 1975
Tongue: English
Weight: 280 KB
Volume: 22
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1975.18076

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