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Direct observation of minority carrier leakage in operating laser diodes by Kelvin probe force microscopy

✍ Scribed by K. S. Ladutenko; A. V. Ankudinov; V. P. Evtikhiev

Book ID: 111450412
Publisher: SP MAIK Nauka/Interperiodica
Year: 2009
Tongue: English
Weight: 151 KB
Volume: 35
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785009060261

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