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Kelvin probe force and surface photovoltage microscopy observation of minority holes leaked from active region of working InGaAs∕AlGaAs∕GaAs laser diode

✍ Scribed by Ankudinov, A. V.; Evtikhiev, V. P.; Ladutenko, K. S.; Rastegaeva, M. G.; Titkov, A. N.; Laiho, R.


Book ID
119996674
Publisher
American Institute of Physics
Year
2007
Tongue
English
Weight
575 KB
Volume
101
Category
Article
ISSN
0021-8979

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