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Spatial distribution of free carrier concentration in vertical GaN Gunn-diode structures studied by confocal micro-Raman spectroscopy and Kelvin probe force microscopy

✍ Scribed by Strelchuk, V. V.; Nikolenko, A. S.; Lytvyn, P. M.; Romanyuk, A. S.; Mazur, Yu. I.; Ware, M. E.; DeCuir, E. A.; Salamo, G. J.; Belyaev, A. E.


Book ID
127131716
Publisher
John Wiley and Sons
Year
2014
Tongue
English
Weight
459 KB
Volume
11
Category
Article
ISSN
1862-6351

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