## Abstract A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular io
Direct microanalysis by negative ion fast atom bombardment mass spectrometry
✍ Scribed by Ryuichi Isobe; Ikuo Fujii; Ken Kanematsu
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 450 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0165-9936
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Negative ion fast atom bombardment mass spectrornetry is used to verify the sequence of ol¡godeoxyri~nucleotides containing a single modified nucleotide. Both the position in the sequence and the rnolecular weight of the modified nucleotide can be determined from the 3 and 5'-phosphate sequence ions