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Direct fabrication of parallel quantum dots with an atomic force microscope

✍ Scribed by U.F Keyser; M Paesler; U Zeitler; R.J Haug; K Eberl


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
160 KB
Volume
13
Category
Article
ISSN
1386-9477

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An atomic force microscope has been used to quantify directly the adhesion between single Aspergillus niger spores and freshly cleaved mica surfaces. The measurements used "spore probes" constructed by immobilizing a single spore at the apex of a tipless AFM cantilever. Adhesion was quantified from